"SUBSTRATE FOR EPITAXY”

Application 1147/CHENP/2004 published 2006-02-03, filed 2004-05-26
The invention relates to a substrate for epitaxy, especially for preparation of nitride semiconductor layers. Invention covers a bulk nitride mono-crystal characterized in that it is a mono-crystal of gallium nitride and its cross-section in a plane perpendicular to c-axis of hexagonal lattice of gallium nitride has a surface area greater than 100 mm2LWLVPRUHWKDQPWKLFNDQGLWV&-plane surface dislocation density is less than 106/cm2, while its volume is sufficient to produce at least one further-processable non-polar A-plane or M-plane plate having a surface area at least 100 mm2. More generally, the present invention covers a bulk nitride mono-crystal which is characterized in that it is a mono-crystal of gallium-containing nitride and its cross-section in a plane perpendicular to c-axis of hexagonal lattice of gallium-containing nitride has a surface area greater than 100 mm2LWLVPRUHPWKLFNDQGLWVVXUIDFHGLVORFDWLRQGHQVLW\LVless than 106/cm2. Mono-crystals according to the present invention are suitable for epitaxial growth of nitride semiconductor layers. Due to their good crystalline quality they are suitable for use in opto-electronics for manufacturing opto-electronic semiconductor devices based on nitrides, in particular for manufacturing semiconductor laser diodes and laser devices. The a.m bulk mono-crystals of gallium-containing nitride are crystallized on seed crystals. Various seed crystals may be used. The bulk mono-crystals of gallium-containing nitride are crystallized by a method involving dissolution of a gallium-containing feedstock in a supercritical solvent and crystallization of a gallium nitride on a surface of seed crystal, at temperature higher and/or pressure lower than in the dissolution process.

Applicant

AMMONO SP. ZO.O. NICHIA CORPORATION
Czerwonego Krzyza 2/31, PL-00-377 Warszawa, POLAND. 491 Oka, Kaminaka-cho, Anan-shi, Tokushima-ken 774-8601,JAPN.

Inventor

International Info

Classification: C30B
Publication Number: PCT/PL02/00077

Priority Information

P-350375 POLAND. 2001-10-26
P-354740 POLAND. 2002-06-26