"CHEMICAL MECHANICAL POLISHING"
Application 1884/DELNP/2008 published 2008-06-27, filed 2008-03-03
Disclosed herein is a chemical mechanical polishing apparatus. The apparatus comprises a carrier to hold a wafer and being capable of lifting, lowering and rotating, a polishing pad compressed onto the wafer through the lowering of the carrier to polish the wafer, a contact pressure sensor to detect contact pressure between the polishing pad and the wafer when the polishing pad is compressed onto the wafer, a support physical property controller to generate control signals corresponding to the contact pressure detected by the contact pressure sensor, a variable physical property support being adapted to come into close contact with the polishing pad and having physical properties varied in response to the control signals generated by the support physical property controller, and a rotational table to hold the variable physical property table. No. of Pages : 28 No. of Claims : 29
Applicant
1)BAE, SEUNG-HUN
:22-506 HANGANG MANSION ICHON-1-DONG YONGSAN-GU, SEOUL 140-724, REPUBLIC OF KOREA. Republic of Korea
Inventor
1)BAE, SEUNG-HUN
International Info
Classification: H01L 21/304
Publication Number: WO 2007/018391
Application Date: 2006-08-07
Priority Information
10-2005-0071543 Republic of Korea 2005-08-05